In digital high speed test and measurement, a perfect clock signal is crucial for the generation of low jitter reference test signals. A clock source that can operate over several decades of frequency is an essential part of any high speed test and measurement environment.
The ability to vary, in a controlled manner, the level and nature of the clock jitter and transfer it to the signal is a key exercise in many R&D as well as production testing. For such stressed test environment, SHF offers a very broad band low jitter clock source, with jitter injection feature, operating over three decades of frequencies from 625 MHz to 67 GHz.
In setups with digital high speed modules and instruments, the clock distribution is always challenging as some parts require a full-clock, others a half-clock, and some even a lower fraction clock signal. Our clock distribution, frequency dividers and frequency doublers are designed to facilitate such a complex test set ups requiring a range of clock signals.
Where a locally recovered clock signal is needed, clock recovery products centered around the 56 GBaud are also available.
Two form factors
For applications where speed, signal quality and flexibility are the key factors, SHF’s plug-in modules to be hosted by a mainframe are the right choice. The mainframe is controlled over an Ethernet connection by an external computer.
SHF’s compact bench-top series provide a high performance signal generation solution to the cost-sensitive industry. The minimal power consumption and the light weight make it perfectly suited e.g. for on-wafer tests.